TY  - BOOK
AU  - Foster, A
TI  - Scanning probe microscopy: atomic scale engineering by forces and currents
SN  - 0-387-40090-7
PY  - 2006///
CY  - Springer
PB  - New York
UR  - http://14.139.222.13:80/cgi-bin/koha/opac-detail.pl?biblionumber=11396
ER  -