TY  - BOOK
AU  - Echlin, Patrick
TI  - Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis
SN  - 978-0-387-85731-2
PY  - 2009///
CY  - Springer
PB  - New York
UR  - http://14.139.222.13:80/cgi-bin/koha/opac-detail.pl?biblionumber=11733
ER  -