TY  - BOOK
AU  - Goldstein, Joseph I
TI  - Scanning electron microscopy and X-ray microanalysis
SN  - 978-0-306-47292-3
PY  - 2003///
CY  - Springer
PB  - N.Y
UR  - http://14.139.222.13:80/cgi-bin/koha/opac-detail.pl?biblionumber=11748
ER  -