TY  - BOOK
AU  - Egerton, Ray F
TI  - Physical principles of electron microscopy: an introduction to TEM, SEM and AEM
SN  - 0-387-25800-0
PY  - 2005///
CY  - Springer
PB  - New York
UR  - http://14.139.222.13:80/cgi-bin/koha/opac-detail.pl?biblionumber=11749
ER  -