000 | 00431nam a2200157Ia 4500 | ||
---|---|---|---|
003 | CGCRI | ||
005 | 20140812102850.0 | ||
008 | 140225s2014 xx 000 0 eng d | ||
040 |
_cCGCRI _bENG |
||
041 | _hENG | ||
100 | _aAmerican Society for Testing and Materials | ||
245 | _aFractography in failure analysis | ||
260 |
_aAmerican Society for Testing and Materials _bPhiladelphia _c1978 |
||
300 | _a390 p. | ||
942 | _cBK | ||
999 |
_c10010 _d10010 |
||
856 |
_uhttp://14.139.222.13:80/cgi-bin/koha/opac-detail.pl?biblionumber=10010 _yhttp://14.139.222.13:80/cgi-bin/koha/opac-detail.pl?biblionumber=10010 |