000 00411nam a2200169Ia 4500
003 CGCRI
005 20140812102902.0
008 140225s2014 xx 000 0 eng d
020 _a0-8247-1992-1
040 _cCGCRI
_bENG
041 _hENG
100 _aChung,Frank H
245 _aIndustrial applications of x-ray diffraction
260 _aMarcel Dekker
_bNew York
_c2000
300 _a1006p.
942 _cBK
999 _c10696
_d10696
856 _uhttp://14.139.222.13:80/cgi-bin/koha/opac-detail.pl?biblionumber=10696
_yhttp://14.139.222.13:80/cgi-bin/koha/opac-detail.pl?biblionumber=10696