| 000 | 00447nam a2200169Ia 4500 | ||
|---|---|---|---|
| 003 | CGCRI | ||
| 005 | 20140812102914.0 | ||
| 008 | 140225s2014 xx 000 0 eng d | ||
| 020 | _a0-387-25800-0 | ||
| 040 |
_cCGCRI _bENG |
||
| 041 | _hENG | ||
| 100 | _aEgerton, Ray F | ||
| 245 | _aPhysical principles of electron microscopy: an introduction to TEM, SEM and AEM | ||
| 260 |
_aSpringer _bNew York _c2005 |
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| 300 | _axii, 202 p. | ||
| 942 | _cBK | ||
| 999 |
_c11369 _d11369 |
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| 856 |
_uhttp://14.139.222.13:80/cgi-bin/koha/opac-detail.pl?biblionumber=11369 _yhttp://14.139.222.13:80/cgi-bin/koha/opac-detail.pl?biblionumber=11369 |
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