000 00598nam a22001697a 4500
003 CGCRI
008 220405b xxu||||| |||| 00| 0 eng d
020 _a978-0-470-63882-8
040 _aCGCRI
_cCGCRI
080 _a537.533.35
_bATO
100 _4Haugstad, Greg
245 _aAtomic force microscopy: understanding basic modes and advanced applications
260 _bJohn Wiley
_c2012
300 _a464p
856 _uhttp://192.168.8.161:80/cgi-bin/koha/opac-detail.pl?biblionumber=Ubiblionumber
_yhttp://192.168.8.161:80/cgi-bin/koha/opac-detail.pl?biblionumber=Ubiblionumber
942 _2udc
_cBK
999 _c12206
_d12199