000 | 00379nam a2200157Ia 4500 | ||
---|---|---|---|
003 | CGCRI | ||
005 | 20140812102659.0 | ||
008 | 140225s2014 xx u 000 0 eng d | ||
040 |
_cCGCRI _bENG |
||
041 | _hENG | ||
100 | _aIS:589-1954 | ||
245 | _aProcedures for basic climatic tests for electronic components | ||
260 |
_aISI _bDelhi _c1954 |
||
300 | _a14p. | ||
942 | _cBK | ||
999 |
_c3375 _d3375 |
||
856 |
_uhttp://14.139.222.13:80/cgi-bin/koha/opac-detail.pl?biblionumber=3375 _yhttp://14.139.222.13:80/cgi-bin/koha/opac-detail.pl?biblionumber=3375 |