000 00379nam a2200157Ia 4500
003 CGCRI
005 20140812102659.0
008 140225s2014 xx u 000 0 eng d
040 _cCGCRI
_bENG
041 _hENG
100 _aIS:589-1954
245 _aProcedures for basic climatic tests for electronic components
260 _aISI
_bDelhi
_c1954
300 _a14p.
942 _cBK
999 _c3375
_d3375
856 _uhttp://14.139.222.13:80/cgi-bin/koha/opac-detail.pl?biblionumber=3375
_yhttp://14.139.222.13:80/cgi-bin/koha/opac-detail.pl?biblionumber=3375