000 00387nam a2200157Ia 4500
003 CGCRI
005 20140812102723.0
008 140225s2014 xx 000 0 eng d
040 _cCGCRI
_bENG
041 _hENG
100 _aAuleytner, J
245 _ax-ray methods in the study of defects in single crystals
260 _aPargamon Press
_bLondon
_c1964
300 _a264p
942 _cBK
999 _c4848
_d4848
856 _uhttp://14.139.222.13:80/cgi-bin/koha/opac-detail.pl?biblionumber=4848
_yhttp://14.139.222.13:80/cgi-bin/koha/opac-detail.pl?biblionumber=4848