000 00413nam a2200157Ia 4500
003 CGCRI
005 20140812102729.0
008 140225s2014 xx 000 0 eng d
040 _cCGCRI
_bENG
041 _hENG
100 _aThornton, P. R
245 _aScaning electron microscopy: applications to materials and device science
260 _aChapman and Hall
_bLondon
_c1968
300 _axv, 368p.
942 _cBK
999 _c5183
_d5183
856 _uhttp://14.139.222.13:80/cgi-bin/koha/opac-detail.pl?biblionumber=5183
_yhttp://14.139.222.13:80/cgi-bin/koha/opac-detail.pl?biblionumber=5183