000 00375nam a2200157Ia 4500
003 CGCRI
005 20140812102737.0
008 140225s2014 xx 000 0 eng d
040 _cCGCRI
_bENG
041 _hENG
100 _aTousimis, A. J., ed.
245 _aElectron probe microanalysis
260 _aAcademic Press
_bNew York
_c1969
300 _axii, 450p.
942 _cBK
999 _c5670
_d5670
856 _uhttp://14.139.222.13:80/cgi-bin/koha/opac-detail.pl?biblionumber=5670
_yhttp://14.139.222.13:80/cgi-bin/koha/opac-detail.pl?biblionumber=5670