| 000 | 00454nam a2200157Ia 4500 | ||
|---|---|---|---|
| 003 | CGCRI | ||
| 005 | 20140812102752.0 | ||
| 008 | 140225s2014 xx 000 0 eng d | ||
| 040 |
_cCGCRI _bENG |
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| 041 | _hENG | ||
| 100 | _aProceedings of a Seminar held at National Bureau of Standard | ||
| 245 | _aQuantitative electron probe microanalysis | ||
| 260 |
_aUnited States Department of Commerce _bWashington _c1968 |
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| 300 | _aviii, 299 p. | ||
| 942 | _cBK | ||
| 999 |
_c6549 _d6549 |
||
| 856 |
_uhttp://14.139.222.13:80/cgi-bin/koha/opac-detail.pl?biblionumber=6549 _yhttp://14.139.222.13:80/cgi-bin/koha/opac-detail.pl?biblionumber=6549 |
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