000 | 00410nam a2200169Ia 4500 | ||
---|---|---|---|
003 | CGCRI | ||
005 | 20140812102803.0 | ||
008 | 140225s2014 xx 000 0 eng d | ||
020 | _a0 408 70353 9 | ||
040 |
_cCGCRI _bENG |
||
041 | _hENG | ||
100 | _aJowett, C E | ||
245 | _aCompatibility and testing of electronic components | ||
260 |
_aButterworths _bLondon _c1972 |
||
300 | _a345 p. | ||
942 | _cBK | ||
999 |
_c7347 _d7347 |
||
856 |
_uhttp://14.139.222.13:80/cgi-bin/koha/opac-detail.pl?biblionumber=7347 _yhttp://14.139.222.13:80/cgi-bin/koha/opac-detail.pl?biblionumber=7347 |