000 00553nam a2200181Ia 4500
003 CGCRI
005 20140812102803.0
008 140225s2014 xx 1000 0 eng d
020 _a0-12-678750-6
040 _cCGCRI
_bENG
041 _hENG
100 _aSwann, P R , ed.
111 _aHigh voltage electron microscopy: proceedings of the third international conference
245 _aHigh voltage electron microscopy: proceedings of the third international conference
260 _aAcademic Press
_bLondon
_c1974
300 _axi, 475p.
942 _cBK
999 _c7394
_d7394
856 _uhttp://14.139.222.13:80/cgi-bin/koha/opac-detail.pl?biblionumber=7394
_yhttp://14.139.222.13:80/cgi-bin/koha/opac-detail.pl?biblionumber=7394