000 00477nam a2200169Ia 4500
003 CGCRI
005 20140812102806.0
008 140225s2014 xx 000 0 eng d
020 _a0-85498-108-X
040 _cCGCRI
_bENG
041 _hENG
100 _aElectron Microscopy and Analysis Group of the Institute of P
245 _aScanning electron microscopy: system and application 1973
260 _aThe Institute of Physics
_bLondon
_c1973
300 _ax,338
942 _cBK
999 _c7525
_d7525
856 _uhttp://14.139.222.13:80/cgi-bin/koha/opac-detail.pl?biblionumber=7525
_yhttp://14.139.222.13:80/cgi-bin/koha/opac-detail.pl?biblionumber=7525