000 00389nam a2200145Ia 4500
003 CGCRI
005 20140812102829.0
008 140225s2014 xx 000 0 eng d
040 _cCGCRI
_bENG
041 _hENG
100 _aKoenings, J. and others
245 _aDeposition of SiO2 with low impurity content by oxidation of SiCl4 in a nonisothermal plasma
260 _c1975
942 _cBK
999 _c8801
_d8801
856 _uhttp://14.139.222.13:80/cgi-bin/koha/opac-detail.pl?biblionumber=8801
_yhttp://14.139.222.13:80/cgi-bin/koha/opac-detail.pl?biblionumber=8801