000 00415nam a2200157Ia 4500
003 CGCRI
005 20140812102833.0
008 140225s2014 xx 000 0 eng d
040 _cCGCRI
_bENG
041 _hENG
100 _aWilliams, David B
245 _aPractical analytical electron microscopy in materials science
260 _aCerlag Chemie international
_bPennsylvania
_c1984
300 _a153
942 _cBK
999 _c9039
_d9039
856 _uhttp://14.139.222.13:80/cgi-bin/koha/opac-detail.pl?biblionumber=9039
_yhttp://14.139.222.13:80/cgi-bin/koha/opac-detail.pl?biblionumber=9039