000 | 00415nam a2200157Ia 4500 | ||
---|---|---|---|
003 | CGCRI | ||
005 | 20140812102833.0 | ||
008 | 140225s2014 xx 000 0 eng d | ||
040 |
_cCGCRI _bENG |
||
041 | _hENG | ||
100 | _aWilliams, David B | ||
245 | _aPractical analytical electron microscopy in materials science | ||
260 |
_aCerlag Chemie international _bPennsylvania _c1984 |
||
300 | _a153 | ||
942 | _cBK | ||
999 |
_c9039 _d9039 |
||
856 |
_uhttp://14.139.222.13:80/cgi-bin/koha/opac-detail.pl?biblionumber=9039 _yhttp://14.139.222.13:80/cgi-bin/koha/opac-detail.pl?biblionumber=9039 |