000 00453nam a2200157Ia 4500
003 CGCRI
005 20140812102834.0
008 140225s2014 xx 000 0 eng d
040 _cCGCRI
_bENG
041 _hENG
100 _aInternational Symposium on Trace Analysis and Technological
245 _aInternational Symposium on Trace Analysis and Technological Development
260 _aPergamon Press
_bOxford
_c1982
300 _app. 689-
942 _cBK
999 _c9099
_d9099
856 _uhttp://14.139.222.13:80/cgi-bin/koha/opac-detail.pl?biblionumber=9099
_yhttp://14.139.222.13:80/cgi-bin/koha/opac-detail.pl?biblionumber=9099