000 00446nam a2200169Ia 4500
003 CGCRI
005 20140812102836.0
008 140225s2014 xx 000 0 eng d
020 _a0-8493-5784-5
040 _cCGCRI
_bENG
041 _hENG
100 _aJohn, Keith Beddow
245 _aParticle characterization in technology, v.1: applications and microanalysis
260 _aCRC
_bBoca Raton, florida
_c1984
300 _a246p.
942 _cBK
999 _c9214
_d9214
856 _uhttp://14.139.222.13:80/cgi-bin/koha/opac-detail.pl?biblionumber=9214
_yhttp://14.139.222.13:80/cgi-bin/koha/opac-detail.pl?biblionumber=9214