000 00325nam a2200145Ia 4500
003 CGCRI
005 20140812102837.0
008 140225s2014 xx 000 0 eng d
040 _cCGCRI
_bENG
041 _hENG
100 _aSmith, J. V.
245 2 _aA review of the Al-O and Si-O distances
260 _c1954
942 _cBK
999 _c9275
_d9275
856 _uhttp://14.139.222.13:80/cgi-bin/koha/opac-detail.pl?biblionumber=9275
_yhttp://14.139.222.13:80/cgi-bin/koha/opac-detail.pl?biblionumber=9275