| 000 | 00447nam a2200169Ia 4500 | ||
|---|---|---|---|
| 003 | CGCRI | ||
| 005 | 20140812102848.0 | ||
| 008 | 140225s2014 xx 000 0 eng d | ||
| 020 | _a0-89006-284-6 | ||
| 040 |
_cCGCRI _bENG |
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| 041 | _hENG | ||
| 100 | _aHakim, Edward B., ed. | ||
| 245 | _aMicroelectronic reliability, Vol. I: reliability, test and diagnostics | ||
| 260 |
_aArtech House _bNorwood _c1989 |
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| 300 | _axviii, 374p. | ||
| 942 | _cBK | ||
| 999 |
_c9911 _d9911 |
||
| 856 |
_uhttp://14.139.222.13:80/cgi-bin/koha/opac-detail.pl?biblionumber=9911 _yhttp://14.139.222.13:80/cgi-bin/koha/opac-detail.pl?biblionumber=9911 |
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