Physical principles of electron microscopy: an introduction to TEM, SEM and AEM
Egerton, Ray F
Physical principles of electron microscopy: an introduction to TEM, SEM and AEM - Springer : New York , 2005
xii, 202 p.
0-387-25800-0
Physical principles of electron microscopy: an introduction to TEM, SEM and AEM - Springer : New York , 2005
xii, 202 p.
0-387-25800-0