Physical principles of electron microscopy: an introduction to TEM, SEM and AEM

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Material type: Text

TextOriginal language: ENG Publication details: Springer New York 2005Description: xii, 202 pISBN:

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Item type	Current library	Call number	Status	Barcode
Books	CGCRI	621.385.833 PHY (Browse shelf(Opens below))	Available	31452

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